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电子电气与通信工程学院
School of Electronic, Electrical and Communication Engineering (EECE)
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Testing and Testable Design of VLSI Systems
Testing and Testable Design of VLSI Systems
Published: 2014-12-08
8205
Name:
Testing and Testable Design of VLSI Systems
No.:
712002Z
Semester:
Hour:
40
Credit:
2.0
Teacher:
Li,Huawei
Introduction:
Content:
Material:
References: